The traditional approach to moving scan test data from chip-level pins to core-level scan channels is under pressure due to the dramatic rise in design size, design complexity, and test adaptation. To ...

The complicated silicon defect types and defect distribution of new IC manufacturing technologies can result in very low yield for new designs and technology nodes. During technology qualification ...

Scan network security and attack mitigation play a pivotal role in safeguarding integrated circuits (ICs) and networked devices from unauthorised access, data extraction, and side‐channel attacks.

Cosmo Tech announced that its Supply Chain Vulnerability Scan is now available on the SAP Store, arming SAP Integrated Business Planning software with an AI-Simulation add-on to deliver supply chain ...