A new method outlines a comprehensive approach to integrated selection and implementation of pipeline leak-detection systems, yielding both lower costs and greater efficiency over the life-cycle of ...
A new technical paper titled “Characterizing the Broadband RF Permittivity of 3D-Integrated Layers in a Glass Wafer Stack from 100 MHz to 30 GHz” was published by researchers at NIST. “We present a ...
(Nanowerk Spotlight) Advances in semiconductor technology have reached a critical turning point. Silicon-based transistor technology, central to electronics, faces increasing limitations due to the ...
In a new review article publication from Opto-Electronic Advances, Yingtao Hu, Di Liang and, Raymond G. Beausoleil from Hewlett Packard Labs discuss advanced III-V-on-silicon photonic integration.
Discover effective protein quantification methods for precision in molecular biology and clinical diagnostics.
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