The HR-E 40-1 passive near-field probe from Langer EMV-Technik measures electrical RF fields up to 40 GHz. Designed to be connected to a spectrum analyzer, oscilloscope, or similar device, the probe ...
Semiconductor testing has traditionally functioned as a stable screening step in the manufacturing flow so that failing devices can be identified and separated prior to packaging. Test infrastructure ...
As new tracking technologies emerge that promise a future where nothing is ever lost, researchers are taking the idea one step further. Why spend precious minutes following sound or visual cues when ...
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